Technical resource published by Applied Physics Corporation — manufacturing cleanroom and metrology systems since 1992.719-428-4042 · [email protected]
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Technical resource

Manufacturer-backed semiconductor metrology guidance with disclosed ownership.

This site translates inspection objectives into better particle wafer specifications and connects qualified requirements to Applied Physics manufacturing.

Published: August 6, 2026Reviewed by: Applied Physics Technical Editorial TeamPublisher: Applied Physics Corporation
Ownership disclosure: Particle Wafer Standards is owned and published by Applied Physics Corporation. Product links may lead to AppliedPhysicsUSA.com. The technical guidance is designed to remain useful whether or not a visitor requests a quote.
Transparency

Ownership

Applied Physics Corporation owns and publishes ParticleWaferStandards.com. Applied Physics manufactures PSL, silica and contamination wafer standards and supports semiconductor metrology applications.

Mission

Purpose

The site is designed to improve specification quality, reduce ambiguous quote requests and build a durable technical reference around wafer standards.

Company

Since 1992

Applied Physics was founded in 1992 and supports semiconductor, cleanroom, laboratory, pharmaceutical and clinical applications worldwide.

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